X-ray determination of the thermal expansion of TiN, TiC and Ti(N,C) crystals

Krystyna Wokulska

doi:10.1117/12.276221

13 June 1997 X-ray determination of the thermal expansion of TiN, TiC and Ti(N,C) crystals

Krystyna Wokulska

Proceedings Volume 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology; (1997) https://doi.org/10.1117/12.276221
Event: XII Conference on Solid State Crystals: Materials Science and Applications, 1996, Zakopane, Poland

Abstract

Precise lattice parameters of stoichiometric TiN, TiC and Ti(N,C) solid solutions whiskers and needle-like crystals have been determined using the Bond's method. Temperature measurement of lattice parameters in the range 290-600 K have been performed and thermal expansion coefficients (alpha) have been determined. A non-linear change of coefficients (alpha) with the composition has been found. The observed decrease of (alpha) values for solid solutions crystals was related to the character of chemical bonds.

Citation Download Citation

Krystyna Wokulska "X-ray determination of the thermal expansion of TiN, TiC and Ti(N,C) crystals", Proc. SPIE 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology, (13 June 1997); https://doi.org/10.1117/12.276221

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