MCP characterization at the Cu and Mo K-alpha x-ray energies

Peter J. Walsh; Scott C. Evans; Gottfried T. Schappert; George A. Kyrala

doi:10.1117/12.294532

12 December 1997 MCP characterization at the Cu and Mo K-alpha x-ray energies

Peter J. Walsh, Scott C. Evans, Gottfried T. Schappert, George A. Kyrala

Proceedings Volume 3173, Ultrahigh- and High-Speed Photography and Image-based Motion Measurement; (1997) https://doi.org/10.1117/12.294532
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

We are investigating the usefulness of microchannel plate (MCP) intensifiers for imaging x-rays at high photon energies, specifically by using filtered x-rays from an electron bombardment source to generate the K_(alpha ) lines of Cu at 8.04 KeV and Mo at 17.5 KeV. These high energy lines are used to measure the resolution of an MCP based intensifier produced at Los Alamos National Laboratory. We have investigated the spot size of a fielded MCP intensifier by observing, on film, the result of a single photon excitation of microchannels. Measurement of the spot size was done with visible light microscopy. We report initial results of spot size spread in the stripline direction. We have also begun a preliminary measurement of the azimuthal anisotropy in the spatial resolution, accentuated at these energies by the inclination of the axis of the MCP channels. We concentrate on an actual 'fielded instrument' resolution, rather than ideal, for the purpose of analyzing image data captured at the NOVA Laser Facility.

Citation Download Citation

Peter J. Walsh, Scott C. Evans, Gottfried T. Schappert, and George A. Kyrala "MCP characterization at the Cu and Mo K-alpha x-ray energies", Proc. SPIE 3173, Ultrahigh- and High-Speed Photography and Image-based Motion Measurement, (12 December 1997); https://doi.org/10.1117/12.294532

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