Advanced techniques in lamp characterization

Ian Lewin; John O'Farrell; James E. Walker III

doi:10.1117/12.284091

26 September 1997 Advanced techniques in lamp characterization

Ian Lewin, John O'Farrell, James E. Walker III

Proceedings Volume 3140, Photometric Engineering of Sources and Systems; (1997) https://doi.org/10.1117/12.284091
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

Perhaps the most significant factor impacting the accuracy of software for the design of illumination optics is the proper characterization of the light source. Techniques used in the past have employed a simplified geometry to model the emitting element of the lamp along with an intensity distribution which has been measured at some fixed distance. This produced major inaccuracies in the prediction of the optical performance of complicated systems. The authors have been active for several years in developing improved techniques for lamp characterization. It is the intent of this paper to describe the aspects of lamp modeling which we have found to be important. These factors include the use of 'far-field' and 'near-field' photometry, the spatial variation of luminance over the lamp, and re-emission of radiation incident on the lamp. The most difficult light sources to model accurately are high intensity discharge sources. Methods are discussed for the solid modeling of such light sources by the use of luminance and intensity data. Instrumentation for the collection of these data is desired.

Citation Download Citation

Ian Lewin, John O'Farrell, and James E. Walker III "Advanced techniques in lamp characterization", Proc. SPIE 3140, Photometric Engineering of Sources and Systems, (26 September 1997); https://doi.org/10.1117/12.284091

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