Paper
28 July 1997 Characterization of ATR systems
Edmund G. Zelnio, Frederick D. Garber, Lori A. Westerkamp, Steven W. Worrell, John J. Westerkamp, Mary Jarratt, Catherine E. Deardorf, Patricia A. Ryan
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Abstract
This paper defines the ATR problem outside the boundaries of the statistical pattern recognition (SPR) problem. It is believed that the state of the art supports successful application of SPR strategies to solve recognition problems and to the extent that the automatic target recognition (ATR) problem and the SPR problem are the same, the ATR problem is quite solvable. However, ATR remains problematic is its full realization and promise and has only been solved under a set of constrained conditions - those which map into the SPR problem. These are problems where the conditions of the training set are totally representative of the conditions under the test set. The purpose of this paper is to facilitate further progress in ATR development by defining the ATR problem in a more general way that is believed to be more representative of the actual ATR problem facing various ATR users rather than the more restricted SPR definition.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Edmund G. Zelnio, Frederick D. Garber, Lori A. Westerkamp, Steven W. Worrell, John J. Westerkamp, Mary Jarratt, Catherine E. Deardorf, and Patricia A. Ryan "Characterization of ATR systems", Proc. SPIE 3070, Algorithms for Synthetic Aperture Radar Imagery IV, (28 July 1997); https://doi.org/10.1117/12.281560
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Cited by 2 scholarly publications.
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KEYWORDS
Automatic target recognition

Sensors

Data modeling

Model-based design

Knowledge acquisition

Picosecond phenomena

Feature extraction

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