Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes

Roderick S. Taylor; Kurt E. Leopold; Mark A. Wendman; Gus Gurley; Virgil B. Elings

doi:10.1117/12.271220

15 April 1997 Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes

Roderick S. Taylor, Kurt E. Leopold, Mark A. Wendman, Gus Gurley, Virgil B. Elings

Proceedings Volume 3009, Micromachining and Imaging; (1997) https://doi.org/10.1117/12.271220
Event: Photonics West '97, 1997, San Jose, CA, United States

Abstract

The adaptation of a Digital Instruments Dimension^TM 3000 atomic-force microscope to provide a near-field scanning optical microscopy capability is described. The enabling technology for the adaptation is the bent optical fiber probe. The design and operation of this probe to measure evanescent fields emerging from optical waveguides is described.

Citation Download Citation

Roderick S. Taylor, Kurt E. Leopold, Mark A. Wendman, Gus Gurley, and Virgil B. Elings "Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes", Proc. SPIE 3009, Micromachining and Imaging, (15 April 1997); https://doi.org/10.1117/12.271220

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