Paper
27 December 1996 Experimental verification of phase contrast image synthesis system
Jesper Glueckstad, Haruyoshi Toyoda, Narihiro Yoshida, Tamiki Takemori, Tsutomu Hara
Author Affiliations +
Proceedings Volume 2969, Second International Conference on Optical Information Processing; (1996) https://doi.org/10.1117/12.262567
Event: Second International Conference on Optical Information Processing, 1996, St. Petersburg, Russian Federation
Abstract
A new method is presented for synthesizing arbitrary grey level intensity patterns based on phase contrast imaging. The concept is grounded on an extension of the Zernike phase contrast method into the domain of full range phase modulation. By controlling the average value of the input phase function and by choosing appropriate phase retardation at the phase contrast filter, a pure phase to intensity imaging is accomplished. The method presented is also directly applicable in dark field image synthesis. Preliminary experimental results are demonstrated for binary-only phase modulation.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jesper Glueckstad, Haruyoshi Toyoda, Narihiro Yoshida, Tamiki Takemori, and Tsutomu Hara "Experimental verification of phase contrast image synthesis system", Proc. SPIE 2969, Second International Conference on Optical Information Processing, (27 December 1996); https://doi.org/10.1117/12.262567
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Phase contrast

Phase shift keying

Image filtering

Optical filters

Phase modulation

Modulation

Computer programming

RELATED CONTENT

Dark GPC
Proceedings of SPIE (March 04 2016)
Phase-only light projection
Proceedings of SPIE (April 17 1998)
New phase contrast methods for optical processing
Proceedings of SPIE (March 06 2002)
Optical Reconstruction Of Phase Images
Proceedings of SPIE (December 07 1981)
Novel method to examine phase object by the use of...
Proceedings of SPIE (October 11 2010)

Back to Top