Temperature effects on reflectance and emittance measurements of Martin Black and Enhanced Martin Black surfaces

Andrew L. Shumway; Donald F. Shepard; Russel E. Clement; Paul McKenna

doi:10.1117/12.258330

11 November 1996 Temperature effects on reflectance and emittance measurements of Martin Black and Enhanced Martin Black surfaces

Andrew L. Shumway, Donald F. Shepard, Russel E. Clement, Paul McKenna

Author Affiliations +

Proceedings Volume 2864, Optical System Contamination V, and Stray Light and System Optimization; (1996) https://doi.org/10.1117/12.258330
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

Martin Black and enhanced Martin Black samples were heated above 620 K and also cooled to 77 K while the directional reflectance and emittance were measured in the spectral region of 1.35 to 26 micrometer. Little emittance variation was found for both surfaces below 300 K. From 77 K to 315 K Martin Black emittance was 98.5% or greater from 7.5 to 24 micrometer. Similarly, enhanced Martin Black emittance was 96% or greater. Furthermore, these conditions apply up to 620 K. Significant reflectance variations below 7.5 micrometer were observed at ambient temperature after baking samples at 620 K both in air and vacuum environments. Reflectance variations as a function of temperature from 300 to 620 K were measured. Humidity and vacuum exposure effects on the surface reflectance properties were also investigated. Post-backed sample reflectance near 5 micrometer was extremely sensitive to ambient air exposure.

Citation Download Citation

Andrew L. Shumway, Donald F. Shepard, Russel E. Clement, and Paul McKenna "Temperature effects on reflectance and emittance measurements of Martin Black and Enhanced Martin Black surfaces", Proc. SPIE 2864, Optical System Contamination V, and Stray Light and System Optimization, (11 November 1996); https://doi.org/10.1117/12.258330

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