Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)

Krzysztof Patorski; Artur G. Olszak

doi:10.1117/12.276312

17 July 1996 Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)

Krzysztof Patorski, Artur G. Olszak

Proceedings Volume 2860, Laser Interferometry VIII: Techniques and Analysis; (1996) https://doi.org/10.1117/12.276312
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

Two optical methods for obtaining the partial derivatives of in-plane and out-of-plane displacement fields in the in-plane ESPSI configuration using temporal phase stepping for automatic analysis of fringe patterns are described. In the first method lateral shear interferograms of object image fields generated by individual symmetrical illuminating beams are recorded independently. The phases are calculated and their subtraction/addition gives required in-plane/out-of-plane displacement derivatives, respectively. Phase stepping is readily performed in the setup based on fiber optics and modulated laser diode illumination. In the second method two primary interferograms: a conventional in-plane displacement ESPI recording and one with object images mutually laterally displaced are recorded. Similarly, software subtraction or addition is performed to separate the out-of-plane displacement derivatives and double sensitivity in-plane displacement information.

Citation Download Citation

Krzysztof Patorski and Artur G. Olszak "Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)", Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); https://doi.org/10.1117/12.276312

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KEYWORDS

Semiconductor lasers

Prisms

Speckle pattern

Beam splitters

Polarization

Fringe analysis

Interferometry

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