Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes

Ahsen M. Hussain; Karsten Dan Joensen; P. Hoeghoej; Finn Erland Christensen; Eric Louis; Harm-Jan Voorma; Yang Soong; Nicholas E. White; Ian S. Anderson

doi:10.1117/12.245113

19 July 1996 Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes

Ahsen M. Hussain, Karsten Dan Joensen, P. Hoeghoej, Finn Erland Christensen, Eric Louis, Harm-Jan Voorma, Yang Soong, Nicholas E. White, Ian S. Anderson

Author Affiliations +

Proceedings Volume 2805, Multilayer and Grazing Incidence X-Ray/EUV Optics III; (1996) https://doi.org/10.1117/12.245113
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

W/Si and Co/C multilayers have been deposited on epoxy- replicated Au mirrors from the ASTRO-E telescope project, SPectrum Roentgen Gamma (SRG) flight mirrors, DURAN glass substrates and Si witness wafers. A characterization of the multilayers with both hard x-rays and soft x-rays is presented. The roughness value obtained from the Si wafers and the DURAN glass are in the range 3.0-4.2 angstrom and 4.4-4.6 angstrom, respectively. For the epoxy-replicated Au mirrors roughnesses of 5.0-5.8 angstrom are achieved, while the roughness of the SRG flight mirrors are in the range of 8.5-11.0 angstrom. This clearly indicates the effectiveness of the epoxy-replication process for the production of smooth substrates for multilayer deposition to be used in future x-ray telescopes.

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Ahsen M. Hussain, Karsten Dan Joensen, P. Hoeghoej, Finn Erland Christensen, Eric Louis, Harm-Jan Voorma, Yang Soong, Nicholas E. White, and Ian S. Anderson "Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes", Proc. SPIE 2805, Multilayer and Grazing Incidence X-Ray/EUV Optics III, (19 July 1996); https://doi.org/10.1117/12.245113

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