CCD simulation system

Victor A. Shilin; A. A. Pugachev

doi:10.1117/12.238201

8 April 1996 CCD simulation system

Victor A. Shilin, A. A. Pugachev

Proceedings Volume 2790, Fifth Conference on Charge-Coupled Devices and CCD Systems; (1996) https://doi.org/10.1117/12.238201
Event: Fifth Conference on Charge-Coupled Devices and CCD Systems, 1995, Krym, Russian Federation

Abstract

A software for simulation of CCD solid-state imagers has been designed. The software consist of simulators for imager process modeling, two and one dimensional charge and potential distribution modeling and simulators for modeling of main characteristics such as spectral response (SR), spectral sensitivity (SS), full noises (FN), and modulation transfer function (MTF). These characteristics may be so calculated jointly for optical blocks (lens system) and solid-state imager which may be based on charge-coupled devices, photodiodes, and photoresistors. Some methods and algorithms are examined for creating of photoelectric, SR, SS, FN and MTF simulators.

Citation Download Citation

Victor A. Shilin and A. A. Pugachev "CCD simulation system", Proc. SPIE 2790, Fifth Conference on Charge-Coupled Devices and CCD Systems, (8 April 1996); https://doi.org/10.1117/12.238201

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available