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27 May 1996 Thin film laser damage mechanisms at the YAG third harmonic
Jean DiJon, Jean Hue, Aysegul Disgecmez, Etienne Quesnel, Bernard Rolland
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Abstract
The morphology of the first damage occurring on either single layer materials or multilayer HR coatings are studied using Scanning Electron Microscopy. For single layers obtained by electron beam evaporation or ion beam sputtering, the damages are always centered on a small size center of about 0.1 micrometers . This center triggers the degradation which presents a well defined shape and size. Two kinds of damage mechanisms occur, either melting of the layer or mechanical breaking of the layer. The same behavior is observed on HR coatings with damage centers located at the interfaces between the high and low index materials of the stack. From these experiments an impurity dominated model is proposed which enables the main features of UV damages to be understood.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean DiJon, Jean Hue, Aysegul Disgecmez, Etienne Quesnel, and Bernard Rolland "Thin film laser damage mechanisms at the YAG third harmonic", Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); https://doi.org/10.1117/12.240350
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Cited by 10 scholarly publications.
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KEYWORDS
Thin films

YAG lasers

Absorption

Interfaces

Laser induced damage

Scanning electron microscopy

Thin film coatings

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