Machine vision inspection of technical ceramics

David R. Patek; Kenneth W. Tobin Jr.; L. Jachter

doi:10.1117/12.232246

21 February 1996 Machine vision inspection of technical ceramics

David R. Patek, Kenneth W. Tobin Jr., L. Jachter

Proceedings Volume 2665, Machine Vision Applications in Industrial Inspection IV; (1996) https://doi.org/10.1117/12.232246
Event: Electronic Imaging: Science and Technology, 1996, San Jose, CA, United States

Abstract

Coors Ceramics Company produces flat rectangular ceramic substrates for technical applications. Presently, finished substrates are inspected by human inspectors for dimensional tolerance and for the absence of a variety of possible surface defects. In a two-phase effort, we developed a system that could measure part dimensional parameters and inspect for surface defects. Dimensional parameters include part width, length, edge straightness, and corner perpendicularity. Surface defects include surface contamination, blemishes, open cracks, edge chips, burrs, pits, dents, ridges, blisters, and hairline cracks. We employed highly parallel pipeline image processing hardware to achieve a throughput rate of 1 part every 2 seconds.

Citation Download Citation

David R. Patek, Kenneth W. Tobin Jr., and L. Jachter "Machine vision inspection of technical ceramics", Proc. SPIE 2665, Machine Vision Applications in Industrial Inspection IV, (21 February 1996); https://doi.org/10.1117/12.232246

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