Confocal imaging through a dielectric interface: aberration modeling

Colin J. R. Sheppard; Peter Torok

doi:10.1117/12.237486

10 April 1996 Confocal imaging through a dielectric interface: aberration modeling

Colin J. R. Sheppard, Peter Torok

Proceedings Volume 2655, Three-Dimensional Microscopy: Image Acquisition and Processing III; (1996) https://doi.org/10.1117/12.237486
Event: Electronic Imaging: Science and Technology, 1996, San Jose, CA, United States

Abstract

The aberrations introduced when focusing within a specimen with a refractive index equal to that of water using an oil-immersion objective are investigated. The peak intensity in the confocal point spread function drops by a factor of two for focusing less than 10 micrometers into the specimen. The effects of scaling of dimensions in the resulting images are discussed. The image exhibits an axial stretching by a factor of about 1.12.

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Colin J. R. Sheppard and Peter Torok "Confocal imaging through a dielectric interface: aberration modeling", Proc. SPIE 2655, Three-Dimensional Microscopy: Image Acquisition and Processing III, (10 April 1996); https://doi.org/10.1117/12.237486

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KEYWORDS

Confocal microscopy

Interfaces

Refractive index

Microscopes

Objectives

Dielectrics

Point spread functions

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