Paper
28 August 1995 Research on intelligent monitoring technology of machining process
Taiyong Wang, Changhong Meng, Guoli Zhao
Author Affiliations +
Proceedings Volume 2620, International Conference on Intelligent Manufacturing; (1995) https://doi.org/10.1117/12.217511
Event: International Conference on Intelligent Manufacturing, 1995, Wuhan, China
Abstract
Based upon research on sound and vibration characteristics of tool condition, we explore the multigrade monitoring system which takes single-chip microcomputers as the core hardware. By using the specially designed pickup true signal devices, we can more effectively do the intelligent multigrade monitoring and forecasting, and furthermore, we can build the tool condition models adaptively. This is the key problem in FMS, CIMS, and even the IMS.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Taiyong Wang, Changhong Meng, and Guoli Zhao "Research on intelligent monitoring technology of machining process", Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); https://doi.org/10.1117/12.217511
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Radium

Computing systems

Surface roughness

Control systems

Fermium

Frequency modulation

Instrument modeling

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