Object-oriented visual language for IC test

XiaoMing Wang; QiaoLin Yang

doi:10.1117/12.217455

28 August 1995 Object-oriented visual language for IC test

XiaoMing Wang, QiaoLin Yang

Proceedings Volume 2620, International Conference on Intelligent Manufacturing; (1995) https://doi.org/10.1117/12.217455
Event: International Conference on Intelligent Manufacturing, 1995, Wuhan, China

Abstract

This paper presents a visual language for integrated circuit (IC) test. It abstracts the test flow as several classes which map to some forms. Test engineers can use the form-based environment which reduces the cost of developing high quality programs. Test classes are defined by AT&T C++ 2.0. Forms are implemented by X-Window. All the systems run on a SUN SPARC workstation.

Citation Download Citation

XiaoMing Wang and QiaoLin Yang "Object-oriented visual language for IC test", Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); https://doi.org/10.1117/12.217455

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