Bare PCB test method based on AI

Aihua Li; Huiyang Zhou; Nianhong Wan; Liangsheng Qu

doi:10.1117/12.217547

28 August 1995 Bare PCB test method based on AI

Aihua Li, Huiyang Zhou, Nianhong Wan, Liangsheng Qu

Proceedings Volume 2620, International Conference on Intelligent Manufacturing; (1995) https://doi.org/10.1117/12.217547
Event: International Conference on Intelligent Manufacturing, 1995, Wuhan, China

Abstract

The shortcomings of conventional methods used for developing test sets on current automated printed circuit board (PCB) test machines consist of overlooking the information from CAD, historical test data, and the experts' knowledge. Thus, the generated test sets and proposed test sequence may be sub-optimal and inefficient. This paper presents a weighting bare PCB test method based on analysis and utilization of the CAD information. AI technique is applied for faults statistics and faults identification. Also, the generation of test sets and the planning of test procedure are discussed. A faster and more efficient test system is achieved.

Citation Download Citation

Aihua Li, Huiyang Zhou, Nianhong Wan, and Liangsheng Qu "Bare PCB test method based on AI", Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); https://doi.org/10.1117/12.217547

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