Microwave characterization of bicrystal grain boundary junctions

Jaroslaw Wosik; Patrick L.-M. Xie; Matthew F. Davis; Nilesh Tralshawala; P. Gierlowski; John H. Miller Jr.

doi:10.1117/12.218170

1 September 1995 Microwave characterization of bicrystal grain boundary junctions

Jaroslaw Wosik, Patrick L.-M. Xie, Matthew F. Davis, Nilesh Tralshawala, P. Gierlowski, John H. Miller Jr.

Proceedings Volume 2559, High-Temperature Microwave Superconductors and Applications; (1995) https://doi.org/10.1117/12.218170
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

We have characterized thin film YBa₂Cu₃O_7-(delta ) (YBCO) bicrystal grain boundary junctions by a non-contact microwave absorption method which is based on the study of dynamic flux quantization in these junctions using the field-modulated-microwave absorption technique. This method is capable of probing the inhomogeneity of coupling in the Josephson junctions. The first derivative of the microwave absorption (dP/dB) as a function of B_dc was measured in a TE₁₀₂ microwave cavity at 9.5 GHz. Epitaxial films of YBCO were deposited by laser ablation on 24 degree(s) bicrystal substrates of SrTiO(subscript 3$. Lengths of the investigated junctions ranged from 100 micrometers to 2 mm. We observed series of well-resolved absorption lines as a function of externally applied dc magnetic field. The nonuniformity of the grain boundary junction coupling was determined using analysis based on the line profile, the amplitude modulation period and microwave power dependence of the series. A physical model, based on the microwave absorption analysis in a single non-uniform Josephson junction was used for the data interpretation. The results of our measurements agree with a model in which the grain boundary consists of several parallel subjunctions.

Citation Download Citation

Jaroslaw Wosik, Patrick L.-M. Xie, Matthew F. Davis, Nilesh Tralshawala, P. Gierlowski, and John H. Miller Jr. "Microwave characterization of bicrystal grain boundary junctions", Proc. SPIE 2559, High-Temperature Microwave Superconductors and Applications, (1 September 1995); https://doi.org/10.1117/12.218170

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