Laser beam induced current (LBIC) spatial imaging as a characterization tool for infrared HgCdTe materials and devices

Kevin A. Fynn; Lorenzo Faraone

doi:10.1117/12.218212

8 September 1995 Laser beam induced current (LBIC) spatial imaging as a characterization tool for infrared HgCdTe materials and devices

Kevin A. Fynn, Lorenzo Faraone

Author Affiliations +

Proceedings Volume 2552, Infrared Technology XXI; (1995) https://doi.org/10.1117/12.218212
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

In this paper, the laser beam induced current (LBIC) technique is applied to the study of HgCdTe infrared materials and devices. In particular, a new quantitative model that relates the LBIC signal to photodiode device parameters is fitted to experimental data obtained from a mid-wavelength infrared (MWIR) HgCdTe photodiode. In addition, the LBIC technique is used to map and identify electrically active defect structures resulting from a novel HgCdTe passivation process in which thermally deposited ZnS is subsequently anodized in a non- aqueous sodium sulphide solution.

Citation Download Citation

Kevin A. Fynn and Lorenzo Faraone "Laser beam induced current (LBIC) spatial imaging as a characterization tool for infrared HgCdTe materials and devices", Proc. SPIE 2552, Infrared Technology XXI, (8 September 1995); https://doi.org/10.1117/12.218212

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