Progress in II-VI photorefractives

George A. Brost; Kevin M. Magde; Sudhir B. Trivedi

doi:10.1117/12.212714

30 June 1995 Progress in II-VI photorefractives

George A. Brost, Kevin M. Magde, Sudhir B. Trivedi

Proceedings Volume 2481, Photonic Device Engineering for Dual-Use Applications; (1995) https://doi.org/10.1117/12.212714
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

Photorefractive ZnTe and CdTe crystals doped with vanadium and/or manganese were grown and characterized in the wavelength range of 0.63 micrometers to 1.52 micrometers . The highest gain was observed in ZnTe:Mn:V (1.5 cm^-1 at 0.63 micrometers ). Through the use of both dopants the effective trap density was increased over an order of magnitude to 4.8 X 10¹⁵ cm^-3. The wavelength sensitivity range of cadmium telluride photorefractives was extended to less than 0.6 micrometers in CD_0.55Mn_0.45Te:V.

Citation Download Citation

George A. Brost, Kevin M. Magde, and Sudhir B. Trivedi "Progress in II-VI photorefractives", Proc. SPIE 2481, Photonic Device Engineering for Dual-Use Applications, (30 June 1995); https://doi.org/10.1117/12.212714

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