Paper
12 May 1995 Flaw detection in d33-mode ceramic multilayer actuators using impedance-frequency scans
Manfred Kahn, Daniel J. Krause, Mark T. Chase
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Abstract
A method to detect linear flaws in piezoelectric actuators is demonstrated. Piezoelectrically induced vibrations are excited in the actuator at a large number of closely spaced frequencies. At frequencies of mechanical resonance there are steep impedance peaks and a peak pattern is generated that is characteristic of a particular actuator configuration. It is shown that when the amplitudes of such peaks are abnormally low, i.e. 50% or less, or when there are peaks > 2kHz removed from 'normal' peak locations, significant internal flaws are present.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Manfred Kahn, Daniel J. Krause, and Mark T. Chase "Flaw detection in d33-mode ceramic multilayer actuators using impedance-frequency scans", Proc. SPIE 2447, Smart Structures and Materials 1995: Industrial and Commercial Applications of Smart Structures Technologies, (12 May 1995); https://doi.org/10.1117/12.209346
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Actuators

Electrodes

Ceramics

Acoustics

Capacitance

Capacitors

Inspection

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