Light scattering in 4Pi-confocal microscopy

Martin Schrader; Stefan W. Hell; Tony Wilson

doi:10.1117/12.205326

23 March 1995 Light scattering in 4Pi confocal microscopy

Martin Schrader, Stefan W. Hell, Tony Wilson

Proceedings Volume 2412, Three-Dimensional Microscopy: Image Acquisition and Processing II; (1995) https://doi.org/10.1117/12.205326
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1995, San Jose, CA, United States

Abstract

We measure the form of the point spread function in the three main configurations of 4 Pi microscopy as well as the traditional confocal arrangement. We confirm, for the first time experimentally, the equivalence between the 4 Pi (A) and 4 Pi (B) geometries. We measure a 6.9 fold increase in axial resolution over the confocal case.

Citation Download Citation

Martin Schrader, Stefan W. Hell, and Tony Wilson "Light scattering in 4Pi confocal microscopy", Proc. SPIE 2412, Three-Dimensional Microscopy: Image Acquisition and Processing II, (23 March 1995); https://doi.org/10.1117/12.205326

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