Ultrafast time resolution in scanning tunneling microscopy

Geoffrey Nunes Jr.; Mark R. Freeman

doi:10.1117/12.205938

30 March 1995 Ultrafast time resolution in scanning tunneling microscopy

Geoffrey Nunes Jr., Mark R. Freeman

Proceedings Volume 2384, Scanning Probe Microscopies III; (1995) https://doi.org/10.1117/12.205938
Event: Photonics West '95, 1995, San Jose, CA, United States

Abstract

We report on two new techniques for obtaining fast time resolution in scanning tunneling microscopy. These techniques allow dynamical studies of processes that lie outside the ordinary bandwidth of the STM. The first of these methods uses a magnetostrictive tip to directly gate the tunnel current. The second method uses a nonlinear characteristic of the tunneling interaction to detect optically induced ultrafast signals. In both techniques, demodulation of the high-speed signal is performed at the tunnel junction itself, which should ultimately lead to the greatest possible time resolution. These stroboscopic techniques may be used whenever repetitive signals can be arranged, as is the case for many electronic, magnetic, and optical phenomena at surfaces.

Citation Download Citation

Geoffrey Nunes Jr. and Mark R. Freeman "Ultrafast time resolution in scanning tunneling microscopy", Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); https://doi.org/10.1117/12.205938

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