Paper
30 March 1995 Probing the forces between complementary strands of DNA with the atomic force microscope
Vincent T. Moy, Ernst-Ludwig Florin, Matthias Rief, Horst Lehmann, Markus Ludwig, Hermann E. Gaub, Klaus Dornmair
Author Affiliations +
Abstract
The atomic force microscope (AFM) is capable of measuring the interaction between tip and sample with high sensitivity and unparalleled spatial resolution. The chemical functionalization of the AFM tips has expanded the versatility of the AFM to experiments where specific molecular interactions are measured. We present here measurements of the interaction between complementary strands of DNA. A necessary prerequisite for the quantitative analysis of the interaction force is knowledge of the spring constant of the cantilevers. We report a method that allows for the in situ measurement of the absolute value of the spring constant of cantilevers based on spectral analysis of the thermal excitations of the cantilever.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vincent T. Moy, Ernst-Ludwig Florin, Matthias Rief, Horst Lehmann, Markus Ludwig, Hermann E. Gaub, and Klaus Dornmair "Probing the forces between complementary strands of DNA with the atomic force microscope", Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); https://doi.org/10.1117/12.205915
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Cited by 2 scholarly publications.
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KEYWORDS
Calibration

Atomic force microscopy

Semiconducting wafers

Atomic force microscope

Molecular interactions

Manufacturing

In situ metrology

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