X-ray performance of the engineering prototype Stellar X-Ray Polarimeter

Eric H. Silver; Klaus Ziock; J. Dwyer; Philip E. Kaaret; Robert Novick; Ronald F. Elsner; Martin C. Weisskopf; Enrico Costa; Paolo Soffitta; Giuseppe Manzo; Andrea E. Santangelo; Igor Y. Lapshov; Rashid Sunyaev

doi:10.1117/12.193200

7 November 1994 X-ray performance of the engineering prototype Stellar X-Ray Polarimeter

Eric H. Silver, Klaus Ziock, J. Dwyer, Philip E. Kaaret, Robert Novick, Ronald F. Elsner, Martin C. Weisskopf, Enrico Costa, Paolo Soffitta, Giuseppe Manzo, Andrea E. Santangelo, Igor Y. Lapshov, Rashid Sunyaev

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Proceedings Volume 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry; (1994) https://doi.org/10.1117/12.193200
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

The performance of the engineering prototype Stellar X-Ray Polarimeter (SXRP) has been evaluated. One hundred percent polarized monochromatic x rays at 2.6 keV and 9.7 keV were used to measure the response of the instrument in the energy bands of the graphite and lithium polarizing elements, respectively. On-line analysis showed that the respective depths of modulation are 96% ad 70% as expected. Irradiating SXRP with broadband unpolarized x rays in the energy band 2 - 17 keV demonstrated that the level of spurious modulation inherent in the instrument is less than 3%. Up-to-date results are presented and compared to the predictions of Monte Carlo simulations.

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Eric H. Silver, Klaus Ziock, J. Dwyer, Philip E. Kaaret, Robert Novick, Ronald F. Elsner, Martin C. Weisskopf, Enrico Costa, Paolo Soffitta, Giuseppe Manzo, Andrea E. Santangelo, Igor Y. Lapshov, and Rashid Sunyaev "X-ray performance of the engineering prototype Stellar X-Ray Polarimeter", Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994); https://doi.org/10.1117/12.193200

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