Two-level x-ray-based explosives detection system

Hermann Ries

doi:10.1117/12.180000

12 July 1994 Two-level x-ray-based explosives detection system

Hermann Ries

Proceedings Volume 2278, X-Ray and UV Detectors; (1994) https://doi.org/10.1117/12.180000
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

X-ray inspection systems have been used on airports for many years to check luggage in order to detect weapons and similar objects. In the meantime the requirements changed and the technology was improved concerning the detection of explosives. Even the requirement of automatic operation can be met. A step-by-step arrangement is described, consisting of two advanced devices: stage one is a new x ray luggage inspection system sensitive to the presence of explosives and other suspicious items, which also copes with the requirement of a high throughput; the second stage is based on x-ray diffraction and provides complementary information on the objects, thus ensuring high quality decisions.

Citation Download Citation

Hermann Ries "Two-level x-ray-based explosives detection system", Proc. SPIE 2278, X-Ray and UV Detectors, (12 July 1994); https://doi.org/10.1117/12.180000

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available