N and K measurement of MCT and PST by polarized reflectometry

Fei-Fei Wu; Wenzhen Song; Hui-Fen Yu; Runqing Jiang; Xiangyang Li; Zhaopeng Liu

doi:10.1117/12.189229

7 October 1994 n and k measurement of MCT and PST by polarized reflectometry

Fei-Fei Wu, Wenzhen Song, Hui-Fen Yu, Runqing Jiang, Xiangyang Li, Zhaopeng Liu

Proceedings Volume 2274, Infrared Detectors: State of the Art II; (1994) https://doi.org/10.1117/12.189229
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

In this paper, the measurement results of n and k of MCT and PST by polarized reflectometry are reported. The results show that in the infrared spectrum region the polarized reflectometry is also an effective method for measurements of n and k.

Citation Download Citation

Fei-Fei Wu, Wenzhen Song, Hui-Fen Yu, Runqing Jiang, Xiangyang Li, and Zhaopeng Liu "n and k measurement of MCT and PST by polarized reflectometry", Proc. SPIE 2274, Infrared Detectors: State of the Art II, (7 October 1994); https://doi.org/10.1117/12.189229

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