Fourier transform spectrometer (FTS) systems with diode-based referencing and autoalignment capabilities

James R. Engel; Rick K. Dorval

doi:10.1117/12.188695

17 October 1994 Fourier transform spectrometer (FTS) systems with diode-based referencing and autoalignment capabilities

James R. Engel, Rick K. Dorval

Author Affiliations +

Proceedings Volume 2269, Infrared Technology XX; (1994) https://doi.org/10.1117/12.188695
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Over the past two decades major advances in FTS have allowed process control engineers to more readily consider the use of this measurement technique. The most striking advance has been in the area of data processing facilitated by extraordinary increases in computing power. The development of improved optical fibers has provided a means for bringing the measurement to the factory floor while providing a remote `laboratory environment' site for the less-than-robust spectrometer optical systems. Recent advances in auto-aligned systems again permit consideration of moving the spectrometer system to locations in close proximity to the process itself. Generally, these systems are based on the use of HeNe lasers for the reference and auto-align mechanism. This results in large and expensive measurement heads to again argue against placement of the spectrometers proximate to the process. This paper describes the successful use of a solid state light source in place of the HeNe laser in an auto- aligned and referenced FTS system which allows consideration of small and inexpensive process control spectrometers. A review of a spectrometer system utilizing a combination of auto-align and referencing technologies utilizing diode sources is presented. DOD and NASA support enabled this dual-use technology to be developed.

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James R. Engel and Rick K. Dorval "Fourier transform spectrometer (FTS) systems with diode-based referencing and autoalignment capabilities", Proc. SPIE 2269, Infrared Technology XX, (17 October 1994); https://doi.org/10.1117/12.188695

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