Lineshape determination using multiple pathlengths in Fourier transform interferometers

William B. Cook

doi:10.1117/12.187588

30 September 1994 Lineshape determination using multiple pathlengths in Fourier transform interferometers

William B. Cook

Proceedings Volume 2266, Optical Spectroscopic Techniques and Instrumentation for Atmospheric and Space Research; (1994) https://doi.org/10.1117/12.187588
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

In Fourier transform spectroscopy degradation in spectral resolution and the introduction of false spectral features (`feet') both result from the limited optical pathlength used by a real instrument. This work describes a quantitative relationship between the truncation length of an interferogram and the distortion of the computed halfwidth for the three most common spectral shapes: Gaussian, Lorentzian, and Voigt profiles. The technique can also be used to aid in the alignment and calibration of a Fourier transform interferometer by deriving a calculated truncated interferogram lineshape of a `known' spectral line to compare with the lineshape actually produced by the instrument.

Citation Download Citation

William B. Cook "Lineshape determination using multiple pathlengths in Fourier transform interferometers", Proc. SPIE 2266, Optical Spectroscopic Techniques and Instrumentation for Atmospheric and Space Research, (30 September 1994); https://doi.org/10.1117/12.187588

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