New ellipsometric approach for thin anisotropic film investigation

Valery N. Filippov; Michael M. Karpuk; Gennadij K. Zhavnerko

doi:10.1117/12.192073

4 November 1994 New ellipsometric approach for thin anisotropic film investigation

Valery N. Filippov, Michael M. Karpuk, Gennadij K. Zhavnerko

Proceedings Volume 2253, Optical Interference Coatings; (1994) https://doi.org/10.1117/12.192073
Event: 1994 International Symposium on Optical Interference Coatings, 1994, Grenoble, France

Abstract

An approach of ellipsometric measurements both from ambient media and from transparent or weakly absorbing substrate has been proposed to determine optical constants and thickness of anisotropic films. According to this approach the main refractive indices are calculated by an iterative procedure while an optimization is used to average the values obtained over the parameters measured at one or several incidence angles. The approach proposed has been used for a determination of optical constants and thickness of multimolecular Langmuir-Blodgett films based on the derivative of 5-[4-(stearoylamino)phenyl] isophthtalic acid.

Citation Download Citation

Valery N. Filippov, Michael M. Karpuk, and Gennadij K. Zhavnerko "New ellipsometric approach for thin anisotropic film investigation", Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); https://doi.org/10.1117/12.192073

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