Paper
25 August 1994 Analysis of near field data of diffused channel waveguides: an accurate method to obtain delta-n and the index profile
Anurag Sharma, Pushpa Bindal
Author Affiliations +
Proceedings Volume 2212, Linear and Nonlinear Integrated Optics; (1994) https://doi.org/10.1117/12.185106
Event: Integrated Optoelectronics '94, 1994, Lindau, Germany
Abstract
A simple and reliable method for obtaining the index profile and the value of (Delta) n of diffused planar and channel waveguides from the near-field scan data is presented. The method involves fitting of the Hermite-Gauss functions to the near-field scan data; the implicit assumption in case of channel waveguides being the separability of the field in its dependence of the two transverse coordinates (x and y). The coefficients of expansion are then used to obtain two 1D index profiles. These two profiles are then suitably combined to give the index profile and the value of (Delta) n of channel waveguides. The validity of the procedure is first tested on planar waveguides. Our simulations show that the method is very stable with respect random errors up to 15 - 20% in the intensity, and accurate estimated for (Delta) n can be reliably obtained. For diffused channel waveguides also, our simulation studies show that the method yields very good estimates for (Delta) n with typical errors being less than a few percent.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anurag Sharma and Pushpa Bindal "Analysis of near field data of diffused channel waveguides: an accurate method to obtain delta-n and the index profile", Proc. SPIE 2212, Linear and Nonlinear Integrated Optics, (25 August 1994); https://doi.org/10.1117/12.185106
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Cited by 6 scholarly publications.
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KEYWORDS
Waveguides

Near field

Channel waveguides

Refractive index

Planar waveguides

Error analysis

Interfaces

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