Paper
30 August 1993 Dielectric loss measurements between 25 - 300 kwith a hemispherical Fabry-Perot resonator
R. Heidinger
Author Affiliations +
Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 21040X (1993) https://doi.org/10.1117/12.2298465
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom
Abstract
A measurement system based on the analysis of TEMP modes in a hemispherical Fabry-Perot resonator around 145 GHzhas been optimized to give access to temperatures as low as 25 K and dielectric loss tangents at 106. The extended perfor- mance which relies on refined data acquisition and conversion methods is shown for special grades of CaF2 and Sapphire.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Heidinger "Dielectric loss measurements between 25 - 300 kwith a hemispherical Fabry-Perot resonator", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 21040X (30 August 1993); https://doi.org/10.1117/12.2298465
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KEYWORDS
Resonators

Dielectrics

Mirrors

Fabry–Perot interferometers

Sapphire

Temperature metrology

Crystals

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