Reliability assessment of 1480/1550 nm filter-based WDM for optical amplifier applications

Gary Duck; Brian Kawasaki

doi:10.1117/12.168625

1 March 1994 Reliability assessment of 1480/1550 nm filter-based WDM for optical amplifier applications

Gary Duck, Brian Kawasaki

Proceedings Volume 2074, Fiber Optics Reliability and Testing: Benign and Adverse Environments; (1994) https://doi.org/10.1117/12.168625
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States

Abstract

The requirements for reliability of optical devices are becoming increasingly stringent. The qualification of new products requires that a variety of tests be performed under a range of severe environmental stress conditions. Results of test programs on an interference filter-based WDM for use in 1480 nm pumped erbium doped optical fiber amplifiers demonstrate that these components can meet existing requirements. With test specifications now requiring test durations of 5000 hours, automated test systems are necessary.

Citation Download Citation

Gary Duck and Brian Kawasaki "Reliability assessment of 1480/1550 nm filter-based WDM for optical amplifier applications", Proc. SPIE 2074, Fiber Optics Reliability and Testing: Benign and Adverse Environments, (1 March 1994); https://doi.org/10.1117/12.168625

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