Transmittance measurements for a variety of x-ray/EUV filter materials and pinhole leak measurements utilizing a new visible light photometer system

Forbes R. Powell; James Fox

doi:10.1117/12.167214

1 February 1994 Transmittance measurements for a variety of x-ray/EUV filter materials and pinhole leak measurements utilizing a new visible light photometer system

Forbes R. Powell, James Fox

Author Affiliations +

Proceedings Volume 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II; (1994) https://doi.org/10.1117/12.167214
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

This paper describes a new visible light photometer system and presents the results of a test program where visible light transmission has been measured for a variety of materials of varying thicknesses. From these measurements, equivalent absorption coefficients are presented for some of the materials commonly used in x-ray and extreme ultraviolet filters. Also presented are some criteria for quantifying light leaks through pinholes.

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Forbes R. Powell and James Fox "Transmittance measurements for a variety of x-ray/EUV filter materials and pinhole leak measurements utilizing a new visible light photometer system", Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); https://doi.org/10.1117/12.167214

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