Soft x-ray and EUV efficiencies of CCDs

Richard C. Catura; Lawrence Shing

doi:10.1117/12.162841

19 November 1993 Soft x-ray and EUV efficiencies of CCDs

Richard C. Catura, Lawrence Shing

Proceedings Volume 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV; (1993) https://doi.org/10.1117/12.162841
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

We present a compilation of CCD quantum efficiency measurements made at soft x-ray and extreme ultraviolet wavelengths. The measurements include CCDs of varying architecture and have been obtained from a number of projects over the last several years.

Citation Download Citation

Richard C. Catura and Lawrence Shing "Soft x-ray and EUV efficiencies of CCDs", Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993); https://doi.org/10.1117/12.162841

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