Determination of the absolute order of one component of the surface displacement due to the evaluation of two interferograms of the specimen recorded under different loads

Thomas Bischof; Werner P. O. Jueptner

doi:10.1117/12.172618

1 March 1994 Determination of the absolute order of one component of the surface displacement due to the evaluation of two interferograms of the specimen recorded under different loads

Thomas Bischof, Werner P. O. Jueptner

Author Affiliations +

Proceedings Volume 2004, Interferometry VI: Applications; (1994) https://doi.org/10.1117/12.172618
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

The holographic interferometry is a tool to detect internal defects of a specimen, due to the recording of the inhomogeneous surface deformation in the area of these defects. By means of a standard evaluation method, e.q. the phase-shifting, the Fourier-transformation or the heterodyning method, it is possible to determine the relative phase distribution of the interference pattern. However, for the quantitative evaluation it is necessary to evaluate the absolute fringe-order. A new method has been developed, which allows the determination of the absolute displacement, based on two interferograms of the specimen, recorded under different loads, provided that the dependence between the load and the displacement is linear.

Citation Download Citation

Thomas Bischof and Werner P. O. Jueptner "Determination of the absolute order of one component of the surface displacement due to the evaluation of two interferograms of the specimen recorded under different loads", Proc. SPIE 2004, Interferometry VI: Applications, (1 March 1994); https://doi.org/10.1117/12.172618

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Holography

Interferometry

Holographic interferometry

Superposition

Defect detection

Differential equations

Heterodyning

Show All Keywords

Keywords/Phrases

Search In:

Publication Years