Suitability of various blister tests for thin film adhesion tests

Kenneth M. Liechti; A. Shirani

doi:10.1117/12.158609

27 September 1993 Suitability of various blister tests for thin film adhesion

Kenneth M. Liechti, A. Shirani

Proceedings Volume 1999, Adhesives Engineering; (1993) https://doi.org/10.1117/12.158609
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Nonlinear von Karman plate theory is used to analyze circular, island and peninsula blister specimens on a consistent basis in order to examine their suitability as interfacial fracture toughness specimens for thin films on substrates. The peninsula specimen was found to be the most promising.

Citation Download Citation

Kenneth M. Liechti and A. Shirani "Suitability of various blister tests for thin film adhesion", Proc. SPIE 1999, Adhesives Engineering, (27 September 1993); https://doi.org/10.1117/12.158609

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