Intersection-point calculations for electron-optical devices

Jerzy M. Woznicki; Jacek Grzegorz Puchalski

doi:10.1117/12.142075

1 April 1993 Intersection-point calculations for electron-optical devices

Jerzy M. Woznicki, Jacek Grzegorz Puchalski

Proceedings Volume 1982, Photoelectronic Detection and Imaging: Technology and Applications '93; (1993) https://doi.org/10.1117/12.142075
Event: Photoelectronic Detection and Imaging: Technology and Applications '93, 1993, Beijing, China

Abstract

A method for computing the intersection point of a ray in a potential field for electron-optical devices is presented. This method is applied for three or four component ray trace schemes which are based on the electron-optical analogy. The method requires only three adjacent integration points of ray trajectory where the last point is located behind the given surface. In this way the best possible accuracy for numerical ray-trace schemes of the fourth order can be obtained.

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Jerzy M. Woznicki and Jacek Grzegorz Puchalski "Intersection-point calculations for electron-optical devices", Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); https://doi.org/10.1117/12.142075

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KEYWORDS

Imaging systems

Ray tracing

Particles

Error analysis

Geometrical optics

Charged particle optics

Numerical analysis

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