Paper
10 August 1993 Control of residual chromatic aberration levels in infrared microscope objective designs
Author Affiliations +
Abstract
The field of infrared micro-spectroscopy chiefly utilizes reflective objective designs due to the broad spectral ranges over which they operate. Some disadvantages of this design methodology are briefly discussed. A technique for the identification of complimentary materials best suited for enhanced achromatic performance over broad spectral regions in the infrared is investigated. This technique is applied to the task of designing refractive microscope objectives capable of diffraction limited performance over the 0.8 (mu) to 12 (mu) spectral range.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christopher Carl Alexay "Control of residual chromatic aberration levels in infrared microscope objective designs", Proc. SPIE 1970, Systems-Oriented Optical Design, (10 August 1993); https://doi.org/10.1117/12.155834
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Lens design

Infrared radiation

Optical design

Reflectivity

Chromatic aberrations

Microscopes

Diffraction

RELATED CONTENT

Design of an ultra-thin dual band infrared system
Proceedings of SPIE (November 05 2014)
Optical design study of a VIS-SWIR 3X zoom lens
Proceedings of SPIE (September 03 2015)
Multispectral infrared imaging optics
Proceedings of SPIE (October 10 2003)
Optical design study for the 1-5 µm spectral band
Proceedings of SPIE (May 06 2009)
TGA FTIR and DSC FTIR combined approaches to solving...
Proceedings of SPIE (March 01 1992)

Back to Top