Paper
15 November 1979 Cavity Radiometer Reflectance
E. F. Zalewski, J. Geist, R. C. Willson
Author Affiliations +
Abstract
The evolution of absorbing surfaces for electrically calibrated radiometers, and techniques for measuring their absorptance (reflectance) are described. A new reflectometer for cavity reflectance measurements, which is based on a ring-shaped silicon photodiode, is described. The results of reflectance measurements on a series of cavities which represent the evolution of cavity technology are presented, and the significance of the results for future research are discussed.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. F. Zalewski, J. Geist, and R. C. Willson "Cavity Radiometer Reflectance", Proc. SPIE 0196, Measurements of Optical Radiations, (15 November 1979); https://doi.org/10.1117/12.957968
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Cited by 3 scholarly publications.
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KEYWORDS
Reflectivity

Coating

Reflectometry

Receivers

Radiometry

Photodiodes

Silicon

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