The reliability of planar GaAs Schottky diodes

Jodi L. Bowers

doi:10.1117/12.2298225

14 December 1992 The reliability of planar GaAs Schottky diodes

Jodi L. Bowers

Proceedings Volume 1929, 17th International Conference on Infrared and Millimeter Waves; 192930 (1992) https://doi.org/10.1117/12.2298225
Event: 17th International Conference on Infrared and Millimeter Waves, 1992, Pasadena, CA, United States

Abstract

Planar GaAs Schottky barrier mixer diodes are now being used in a variety of applications at millimeter and submillimeter wavelengths. Since these devices are being considered for space applications, device reliability is a critical issue. This paper presents first results from accelerated life testing of planar mixer diodes.

Citation Download Citation

Jodi L. Bowers "The reliability of planar GaAs Schottky diodes", Proc. SPIE 1929, 17th International Conference on Infrared and Millimeter Waves, 192930 (14 December 1992); https://doi.org/10.1117/12.2298225

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available