Paper
28 May 1993 Measuring surface roughness on wood: a comparison of laser-scatter and stylus-tracing approaches
James W. Funck, Johannes B. Forrer, David A. Butler, Charles C. Brunner, Alberto G. Maristany
Author Affiliations +
Proceedings Volume 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing; (1993) https://doi.org/10.1117/12.145533
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States
Abstract
Many wood products manufacturing processes require a 3-dimensional measure of surface roughness to determine processing parameters and product grades and values. Currently, on- line measurement of wood surface roughness is limited to visual inspection and single-point laser-based triangulation or ultrasonic systems, while most off-line analysis is based on stylus tracing. Wood has unique characteristics that complicate surface texture measurement and analysis such as the need to separate distinct causes of error of form, waviness, and roughness as well as to correlate visual grades of processing standards with 1-dimensional (1-D), 2-D, and 3-D measures. This paper discusses the performance characteristics of a laser scatter/optical imaging system for wood roughness measurement and compares them to those of a stylus tracing system. The abilities of both approaches to capture the types of roughness information required in wood manufacturing processes are discussed as well as the functionality of 1-D, 2-D, and 3-D roughness descriptors.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James W. Funck, Johannes B. Forrer, David A. Butler, Charles C. Brunner, and Alberto G. Maristany "Measuring surface roughness on wood: a comparison of laser-scatter and stylus-tracing approaches", Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993); https://doi.org/10.1117/12.145533
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Cited by 28 scholarly publications.
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KEYWORDS
Surface roughness

Imaging systems

Laser scattering

Standards development

Visualization

Manufacturing

Error analysis

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