Radiation-induced transmission loss of integrated optic waveguide devices

Henning Henschel; Otmar Koehn; Hans Ulrich Schmidt

doi:10.1117/12.141873

6 April 1993 Radiation-induced transmission loss of integrated optic waveguide devices

Henning Henschel, Otmar Koehn, Hans Ulrich Schmidt

Proceedings Volume 1794, Integrated Optical Circuits II; (1993) https://doi.org/10.1117/12.141873
Event: Fibers '92, 1992, Boston, MA, United States

Abstract

The radiation sensitivity of different integrated optic (IO) devices was compared under standardized test conditions. We investigated four relatively simple device types made by four different manufacturers. The waveguide materials were proton exchanged LiTaO₃, LiNbO₃:Ti, Tl-diffused glass, and Ag-diffused glass, respectively. In order to standardize the irradiation parameters we followed the 'Procedure for Measuring Radiation-Induced Attenuation in Optical Fibers and Optical Cables' proposed by the NATO NETG as close as possible. In detail we made pulsed irradiations with dose values of about 500 rad*, 10⁴ rad, and 10⁵ rad, as well as continuous irradiations at a ⁶⁰Co source with a dose rate of 1300 rad*/min up to a total dose of 10⁴ rad. Device temperatures were about 22 degree(s)C, -50 degree(s)C, and +80 degree(s)C.

Citation Download Citation

Henning Henschel, Otmar Koehn, and Hans Ulrich Schmidt "Radiation-induced transmission loss of integrated optic waveguide devices", Proc. SPIE 1794, Integrated Optical Circuits II, (6 April 1993); https://doi.org/10.1117/12.141873

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