Interferometer for measurement of absolute refractive index and thickness

Serguei A. Alexandrov; Igor V. Chernyh

doi:10.1117/12.140813

15 February 1993 Interferometer for measurement of absolute refractive index and thickness

Serguei A. Alexandrov, Igor V. Chernyh

Proceedings Volume 1756, Interferometry: Applications; (1993) https://doi.org/10.1117/12.140813
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

The interferometer model for measurement of the absolute refractive index of the optical media with the accuracy of 0.00001 has been developed, manufactured and researched. The sample for test to be manufactured as the flat parallel plate. The interferometer gives possibility to defined sample geometrical thickness with accuracy 0.0002 mm simultaneously with index measurement. The range of index and thickness measurements is not limited in principle. The interferometer allows testing of solid, liquid and gaseous media.

Citation Download Citation

Serguei A. Alexandrov and Igor V. Chernyh "Interferometer for measurement of absolute refractive index and thickness", Proc. SPIE 1756, Interferometry: Applications, (15 February 1993); https://doi.org/10.1117/12.140813

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