Efficient polarizers for infrared ellipsometry

Karl Barth; Fritz Keilmann

doi:10.1117/12.138809

11 December 1992 Efficient polarizers for infrared ellipsometry

Karl Barth, Fritz Keilmann

Proceedings Volume 1746, Polarization Analysis and Measurement; (1992) https://doi.org/10.1117/12.138809
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

We have employed novel metal grid polarizers with improved polarization contrast to build a far-infrared rotating-analyzer ellipsometer. Using a step-tunable, optically pumped gas laser as the light source we can determine the complex dielectric function in the spectral range from 10 to 250 cm^-1. A cryostat allows reflection measurements under flat angles of incidence between temperatures from 10 to 300 K. We present measurements on high-T_CYBaCuO type ceramics.

Citation Download Citation

Karl Barth and Fritz Keilmann "Efficient polarizers for infrared ellipsometry", Proc. SPIE 1746, Polarization Analysis and Measurement, (11 December 1992); https://doi.org/10.1117/12.138809

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