Paper
2 February 1993 Characterization of 3He area sensitive proportional counters at IPNS for SANS applications
Pappannan Thiyagarajan, K. F. Bradley, Roy Kent Crawford, J. E. Epperson, Denis Wozniak, John M. Carpenter
Author Affiliations +
Abstract
The Small Angle Diffractometer (SAD) at the Intense Pulsed Neutron Source (IPNS) utilizes a 20 X 20 cm2 Borkowski-Kopp type 3He position sensitive detector (PSD) which has reliably performed small-angle neutron scattering experiments for more than a decade. The pulsed-source based SAD employs a small, but fixed, sample-to-detector distance and a pulsed polychromatic neutron beam. The neutron energies are resolved through time-of- flight (TOF) measurements so that a much wider range of momentum transfer is probed in a single measurement compared to the range of spectrometers using monochromatic incident beams. However, the pulsed source requires a short sample-to-detector distance so that the detector covers a large solid angle, but with lower angular resolution, and this situation puts stringent demands on the spatial resolution of the detector. Previously, nonlinearities in the position encoding of detected neutrons required that the outer channels of the detector, representing 40% of the detector area, be discarded. This paper presents a technique to characterize both the position encoding and the position resolution of the entire detector so that the whole detector can be used for SANS measurements.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pappannan Thiyagarajan, K. F. Bradley, Roy Kent Crawford, J. E. Epperson, Denis Wozniak, and John M. Carpenter "Characterization of 3He area sensitive proportional counters at IPNS for SANS applications", Proc. SPIE 1737, Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications, (2 February 1993); https://doi.org/10.1117/12.138664
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KEYWORDS
Sensors

Spatial resolution

Computer programming

Floods

Scattering

Gamma radiation

Electronics

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