Paper
28 August 1992 Performance of a high-frame-rate CCD imager
Peter A. Levine, Donald J. Sauer, Fu-Lung Hseuh, Frank V. Shallcross, Grazyna M. Meray, Gordon Charles Taylor, Gary W. Hughes, John M. Pellegrino, Deborah R. Simon, Lorna J. Harrison, William B. Lawler
Author Affiliations +
Abstract
Back-illuminated, 16-port 512 X 512 and 32-port 1024 X 1024 charge coupled device (CCD) imagers have been fabricated. The measured performance of the 512 X 512 pixel chip is described, including data on quantum efficiency, dynamic range, dark current, frame rates, uniformity, contrast transfer function, and on-chip correlated double- sampling (CDS) amplifier noise. We have previously reported on these designs. The CCD arrays are designed with a unique combination of parameters optimized for applications requiring high resolution combined with high frame rates and wide dynamic range. The imaging registers achieve 100% optical fill factor and high quantum efficiency through the use of substrate thinning and back-side illumination. The high frame-rate readout is obtained by the use of a dual storage register and multiple floating-diffusion output ports which reduce the 512 X 512 array readout frequency to 15 MHz for 800 frame per second operation. On- chip CDS amplifiers are included in each output port to reduce the readout noise and simplify off-chip analog signal processing. Both designs include a buried anti-blooming drain structure and electro static discharge (ESD) protection.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter A. Levine, Donald J. Sauer, Fu-Lung Hseuh, Frank V. Shallcross, Grazyna M. Meray, Gordon Charles Taylor, Gary W. Hughes, John M. Pellegrino, Deborah R. Simon, Lorna J. Harrison, and William B. Lawler "Performance of a high-frame-rate CCD imager", Proc. SPIE 1693, Surveillance Technologies II, (28 August 1992); https://doi.org/10.1117/12.138074
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Cited by 3 scholarly publications.
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KEYWORDS
Cadmium sulfide

Imaging systems

Charge-coupled devices

Quantum efficiency

Signal processing

Interference (communication)

Semiconducting wafers

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