Paper
1 September 1992 Infrared detector circuits using monolithic CMOS Op-Amps with InSb detectors in a transimpedance configuration
Author Affiliations +
Abstract
As the emphasis in infrared detector research shifts toward larger and more complicated arrays the amount of time spent on simple single-element and small arrays is decreasing. One set of applications where discrete detectors and arrays are still finding use is in satellites. In addition, scanned imaging arrays based on single element detectors and small arrays are still being manufactured. Discussion here is for small arrays and single element detectors. One of the aspects of detector operation that always needs to be addressed is amplification. Often detectors are attached to amplifiers through rather long leads. Such systems are subject to unwanted microphonic response as a result of the motion of the leads relative to each other or to the ground plane. This sort of microphonic response can many times be eliminated through careful wiring and routing techniques, however, in some severe environments it is not possible to eliminate all microphonic response. A commonly used solution to this problem is to hybridize the detector with a JFET front end to reduce the effective output resistance of the detector circuit relative to the amplifier input. The TIA in such configurations is completed off the focal plane at room temperature. This means that half the circuit is operating at cryogenic temperatures while the other part is operating at room temperature some distance away. Ideally it would be more convenient, if not better, to include the amplifier on the focal plane with the detector. (Of course this hybridization is necessary for large two-dimensional arrays.) Data have been acquired to show some of the limitations and opportunities for such an approach. Typical bipolar operational amplifiers (OP-27, OP-37, LM108) will not operate well at cryogenic temperatures. CMOS operational amplifiers generally will operate at cryogenic temperatures but suffer from high front-end voltage noise. The TLC2201 from Texas Instruments is a CMOS op-amp manufactured for low voltage noise. A discussion of its applicability to IR detector operation is presented herein.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David S. Smith "Infrared detector circuits using monolithic CMOS Op-Amps with InSb detectors in a transimpedance configuration", Proc. SPIE 1685, Infrared Detectors and Focal Plane Arrays II, (1 September 1992); https://doi.org/10.1117/12.137809
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Amplifiers

Field effect transistors

Infrared detectors

Capacitance

Cryogenics

Infrared sensors

Back to Top