Use of narrowband laser speckle for MTF characterization of CCDs

Martin Sensiper; Glenn D. Boreman; Alfred Dale Ducharme; Donald R. Snyder

doi:10.1117/12.137767

12 August 1992 Use of narrowband laser speckle for MTF characterization of CCDs

Martin Sensiper, Glenn D. Boreman, Alfred Dale Ducharme, Donald R. Snyder

Proceedings Volume 1683, Infrared Focal Plane Array Producibility and Related Materials; (1992) https://doi.org/10.1117/12.137767
Event: Aerospace Sensing, 1992, Orlando, FL, United States

Abstract

This paper presents a method for measuring the modulation transfer function (MTF) of a detector array from zero frequency to twice the Nyquist frequency. The equipment is simple and requires no complex optical components. Also, the use of laser speckle circumvents the problems inherent with traditional methods of MTF testing where the phase of the test target with respect to the sampling grid affects the observed contrast. The MTF measured with this method is compared to the MTF measured using sine targets. The results of the two methods agree to within 2%.

Citation Download Citation

Martin Sensiper, Glenn D. Boreman, Alfred Dale Ducharme, and Donald R. Snyder "Use of narrowband laser speckle for MTF characterization of CCDs", Proc. SPIE 1683, Infrared Focal Plane Array Producibility and Related Materials, (12 August 1992); https://doi.org/10.1117/12.137767

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