Paper
26 June 1992 High power, high reliability laser diodes
Donald R. Scifres, David F. Welch, Richard R. Craig, Erik P. Zucker, Jo S. Major Jr., Gary L. Harnagel, Masamichi Sakamoto, James M. Haden, John G. Endriz, Hsing H. Kung
Author Affiliations +
Abstract
Results are presented on catastrophic damage limits and life-test measurements for four types of high-power laser diodes operating at wavelengths between 980 nm and 690 nm. The laser diodes under consideration are CW multimode lasers, CW laser bars, quasi-CW bars/2D stacked arrays, and single transverse mode lasers.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald R. Scifres, David F. Welch, Richard R. Craig, Erik P. Zucker, Jo S. Major Jr., Gary L. Harnagel, Masamichi Sakamoto, James M. Haden, John G. Endriz, and Hsing H. Kung "High power, high reliability laser diodes", Proc. SPIE 1634, Laser Diode Technology and Applications IV, (26 June 1992); https://doi.org/10.1117/12.59136
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Continuous wave operation

Semiconductor lasers

High power lasers

Laser applications

Diodes

Heatsinks

Technologies and applications

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