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29 July 1992 Examination of laser conditioning using atomic-force microscopy
Aleta A. Tesar, Mehdi Balooch, Robert J. Tench, Christopher J. Stolz, Timothy G. Sarginson, Wigbert J. Siekhaus
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Proceedings Volume 1624, Laser-Induced Damage in Optical Materials: 1991; (1992) https://doi.org/10.1117/12.60121
Event: Laser-Induced Damage in Optical Materials: 1991, 1991, Boulder, CO, United States
Abstract
The modification of an optical coating surface with laser exposure at fluences below the damage threshold resulted in localized minimization of asperities. Topological changes with time were mapped using an atomic force microscope. It is suggested that charge accumulation on the dielectric coating drives the surface morphology to higher uniformity.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Aleta A. Tesar, Mehdi Balooch, Robert J. Tench, Christopher J. Stolz, Timothy G. Sarginson, and Wigbert J. Siekhaus "Examination of laser conditioning using atomic-force microscopy", Proc. SPIE 1624, Laser-Induced Damage in Optical Materials: 1991, (29 July 1992); https://doi.org/10.1117/12.60121
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KEYWORDS
Microscopy
Atomic force microscope
Coating
Dielectrics
Laser damage threshold
Optical coatings
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